Xavis X-Ray System

We offer the Xavis X-ray inspection system.  It can inspect for contaminants such as Ferrous and non-ferrous metals but also stainless steel (mesh/wire), stone, glass, bone etc.

See below for more info.

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Description

We offer the Xavis X-ray inspection system.  It can inspect for contaminants such as Ferrous and non-ferrous metals but also stainless steel (mesh/wire), stone, glass, bone etc, in a wide variety of products and guarantees the best-in-class detection performance identifying up to 0.2mm lead particle, 0.28 stainless steel (particle or wire) and 1.2mm stone or glass in diameter.

Functions

  • Missing / Shape inspection
  • Networking
  • Contaminant size measuring function
  • Image thumbnail
  • USB port
  • Production/operation status management
  • Masking
  • Auto teaching
  • Full suite of inspection features
  • Reporting
  • Image reinspection
  • Maintenance cycle management
  • Auto image saving
  • Register for up to 10,000 products
  • Zoom function
  • Adjustable belt speed

This range of products has outstanding reliablility and operability.  It has been proven in micro semiconductor industry applications and has robust detection performance.

Certifications

  • ISO9001
  • CE
  • Inspection certificate
  • Design certificate
  • Production license

Click to view the brochure: Xavis Brochure