Description
We offer the Xavis X-ray inspection system. It can inspect for contaminants such as Ferrous and non-ferrous metals but also stainless steel (mesh/wire), stone, glass, bone etc, in a wide variety of products and guarantees the best-in-class detection performance identifying up to 0.2mm lead particle, 0.28 stainless steel (particle or wire) and 1.2mm stone or glass in diameter.
Functions
- Missing / Shape inspection
- Networking
- Contaminant size measuring function
- Image thumbnail
- USB port
- Production/operation status management
- Masking
- Auto teaching
- Full suite of inspection features
- Reporting
- Image reinspection
- Maintenance cycle management
- Auto image saving
- Register for up to 10,000 products
- Zoom function
- Adjustable belt speed
This range of products has outstanding reliablility and operability. It has been proven in micro semiconductor industry applications and has robust detection performance.
Certifications
- ISO9001
- CE
- Inspection certificate
- Design certificate
- Production license
Click to view the brochure: Xavis Brochure
